VUE 250-P NexGen

This picture shows OKOS Product - Semiconductor System VUE400P NEXGEN

VUE 250-P NexGen
Scanning Acoustic Microscope

Semiconductor & Electronics Failure Analysis,

Reliability Counterfeit detection, voids, disbonds,

die-attach, cracks, delamination 

Contact Us
This picture shows OKOS Product - Semiconductor System VUE400P NEXGEN

VUE 250-P NexGen
Scanning Acoustic Microscope

Semiconductor & Electronics Failure Analysis,

Reliability Counterfeit detection, voids, disbonds,

die-attach, cracks, delamination 

Contact Us

01 Features

Scan Area

322 mm x 136 mm

Single JEDEC Trays


Inspection

Pulse Echo | Through Transmission


Transducers

1 MHz to 150 MHz


Instrumentation

Up to 300 MHz Pulser-Receiver

Up to 4 GHz Sampling Rate

8 bits Dynamic Range

02 Construction

Performance

Max Velocity 500 mm/s on Scan Axis

5-micron encoder scan resolution


Form Factor

Stainless Steel Tank

HD LED Lighting

Tray Fixture



Dimensions

700 mm (left to right)

560 mm / (front to back)

Net Weight 81 Kg


03 Software

Inspection & Analysis

Multi Zone Inspection (SALI)

C-Scans, B-Scans, A-Scan

Peak Amplitude & Time of Flight

Defect Detection

Thickness Measurement

Cluster Analysis

Histogram

Void Analysis

Quantification

Go/No-Go Classification


User Interface

Modes: Advanced | Engineer | Operator


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