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Comprehensive SAM Solutions
In-line or In Lab
OKOS is at the forefront of failure analysis and non destructive testing technologies. From our Scanning Acoustic Microscopes and Non Destructive Testing Scanners to our custom transducers and digitizers and our exclusive ODIS software, we offer comprehensive solutions to all of your material testing needs…
We offer the next generation Scanning Acoustic Microscopy solutions for Integrity Assessment of Semiconductor Packages (Plastic Package, Flip Chip, Motherboards, LED/LCD Panels and Wafers). The components that make up our state of the art microscopes are Special Transducers, Custom Digitizers and Exclusive WinSam Software. Our engineers have worked diligently to bring you unparallelled technology in the failure analysis arena. Our acoustic microscopes will get to the root of your problems, helping you formulate viable solutions...
Tips and Techniques
You can count on our exceptionally well qualified team of experts with deep industry experience to provide support solutions. Our in depth knowledge helps us to provide the best results for your new and existing applications, keeping your operators up to date on the latest scanning techniques to make the best use of your capital investment...