MACROVUE-P NexGen

MACROVUE -P NexGen

Scanning Acoustic Microscope

Semiconductor & Electronics Failure Analysis, Reliability Counterfeit detection, voids, disbonds, die-attach, and etc.


This picture shows OKOS Product - Semiconductor System VUE400P NEXGEN

MACROVUE-P NexGen
Scanning Acoustic Microscope

Semiconductor & Electronics Failure Analysis,

Reliability Counterfeit detection, voids, disbonds,

die-attach, cracks, delamination 

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01 Features

Scan Area

Up to 2500 mm x 1500 mm



Inspection

Pulse Echo | Through Transmission

Simultaneous 2 JEDEC Trays C-Scan PE

Simultaneous 1 JEDEC Tray C=Scan PE|TT


Transducers

1 MHz to 230 MHz


Instrumentation

Digital Pulser-Receiver

Optional second channel

Up to 12 GHz Digitizer

02 Construction

Performance

Max Velocity 1.5 m/s on Scan Axis

0.5 micron encoder scan resolution


Accessories

Integrated Water Management


Form Factor

Stainless Steel Tank

HD LED Lighting


Applications

Solar Panels

Large Panels

Custom PCBs


03 Software

Inspection & Analysis

Multi Zone Inspection (SALI)

C-Scans, B-Scans, A-Scan

Peak Amplitude & Time of FlightD

Defect Detection

Thickness Measurement

Cluster Analysis

Histogram

Void Analysis

Quantification

Go/No-Go Classification


User Interface

Modes: Advanced | Engineer | Operator


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