UT NDT System for Pipe, Tube & Billet Inspection

 MACROVUE 2000-P
Scanning Acoustic Microscope

Semiconductor & 
Electronics Failure Analysis,
Reliability Counterfeit detection, voids, disbonds,
die-attach, cracks, delamination 

01 Features

Scan Area

380 mm x 360 mm

Two JEDEC Trays


Inspection

Pulse Echo | Through Transmission

Simultaneous 2 JEDEC Trays C-Scan PE

Simultaneous 1 JEDEC Tray C=Scan PE|TT


Transducers

1 MHz to 230 MHz



Instrumentation

Up to 500 MHz Pulser-Receiver

Up to 12 GHz Sampling Rate

8 to 12 bits Dynamic Range

02 Construction

Performance

Max Velocity 1.5 m/s on Scan Axis

0.5 micron encoder scan resolution


Accessories

Integrated Water Management


Form Factor

Stainless Steel Tank

HD LED Lighting

Tray Fixture

Wafer Fixture


Dimensions

885 mm/34.84" (left to right)

816 mm / 32/12" (front to back)

Net Weight 250 Kg


03 Software

Inspection & Analysis

Multi Zone Inspection (SALI)

C-Scans, B-Scans, A-Scan

Peak Amplitude & Time of FlightD

Defect Detection

Thickness Measurement

Cluster Analysis

Histogram

Void Analysis

Quantification

Go/No-Go Classification


User Interface

Modes: Advanced | Engineer | Operator


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